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[SG17838] Nanometrics XLS75 Optical scatterometry CD SEM 

Item No
17838
Category
FAB / Metrology
Date
2016-02-02 19:05:02
Serial Number
9010OCD-0904-0013
Vintage
2004
Wafer Size
8
Price
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Contact Info
SurplusGLOBAL Korea Tel : 82-31-615-6800
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