Used and refurbished semiconductor equipment marketplace | SurplusGLOBAL

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Marketplace SurplusGLOBAL

Used and refurbished semiconductor equipment marketplace

Equipment List
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Manufacturer

KLA-Viper-2435
KLA-Viper-2435
KLA-Viper-2435

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[Remarketing] KLA Viper 2435

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Remarketing
Event [Remarketing for GLOBALFOUNDRIES] Bid for 323 units of Semiconductor Equipment
  • Code : LMAC791
  • Location : Singapore
Contact Info
SurplusGLOBAL, USA +1-408-436-5347 Email
Product Specialist
Jackson Choi +82-31-728-1400 Email

Recommendations

KLA-FX200-Thickness-measurement

[SG52657]
KLA FX200 Thickness measurement

Metrology
Hitachi-RS4000-DR-SEM

[SG32068]
Hitachi RS4000 DR SEM

Metrology
Rudolph-Axi-S-Macro-inspection

[SG28544]
Rudolph Axi-S Macro inspection

Metrology
Hitachi-S-5200-FE-SEM

[SG28527]
Hitachi S-5200 FE SEM

Metrology
Nanometrics-Caliper-Mosaic-Overlay

[SG36430]
Nanometrics Caliper Mosaic Overlay

Metrology
ASML-XT1250D-ArF-Scanner

[SG45728]
ASML XT1250D ArF Scanner

Scanner
TEL-LITHIUS-COT-DEV

[SG44660]
TEL LITHIUS COT/DEV

Track
Mattson-Aspen-3-Lite-Lite-Echer

[SG41802]
Mattson Aspen 3 Lite Lite Echer

Asher
AMAT-Centura-DPS2-Poly-Poly

[SG44971]
AMAT Centura DPS2 Poly Poly

Etch
Canon-FPA-6000ES6a-90nm-KrF-Scanner

[SG40116]
Canon FPA-6000ES6a 90nm KrF Scanner

Scanner
TEL-Indy-B-DCS-Nit

[SG45298]
TEL Indy-B DCS Nit

Furnace
Novellus-Gamma2130-Asher

[SG35704]
Novellus Gamma2130 Asher

Asher
AMAT-Centura-DPS2-532-Metal-Metal

[SG23869]
AMAT Centura DPS2 532 Metal Metal

Etch
BMR-ICP-Etcher-ICP-Etch

[SG36639]
BMR ICP Etcher ICP Etch

Etch
Canon-FPA-3000i4-Stepper

[SG71781]
Canon FPA-3000i4 Stepper

Stepper
Nikon-OPTIPHOT-66-Microscope

[SG18518]
Nikon OPTIPHOT 66 Microscope

Others
TEL-Indy-A-DCS-Nit

[SG42053]
TEL Indy-A DCS Nit

Furnace
Canon-FPA-5500iZ-350nm,-i-Line-Stepper

[SG49031]
Canon FPA-5500iZ 350nm, i-Line Stepper

Stepper
Canon-FPA-5500iZ+-350nm,-i-Line-Stepper

[SG49343]
Canon FPA-5500iZ+ 350nm, i-Line Stepper

Stepper
Nissin-Exceed-3000AH-Medium-Current-Implanter

[SG49038]
Nissin Exceed 3000AH Medium Current Implanter

Implant

Related Items

Rudolph-Axi-S-Macro-inspection

[SG28544]
Rudolph Axi-S Macro inspection

Metrology
KLA-FX200-Thickness-measurement

[SG52657]
KLA FX200 Thickness measurement

Metrology
default

[R80457]
KLA INS3000

Metrology
Hitachi-S-5200-FE-SEM

[SG28527]
Hitachi S-5200 FE SEM

Metrology
default

[B71103]Bid on Sale
Rigaku SYS3630

Metrology
Nanometrics-Caliper-Mosaic-Overlay

[SG36430]
Nanometrics Caliper Mosaic Overlay

Metrology
Hitachi-RS4000-DR-SEM

[SG32068]
Hitachi RS4000 DR SEM

Metrology
Rudolph-WV320-Macro-Defect-inspection

[R52953]
Rudolph WV320 Macro Defect inspection

Metrology
KLA-Archer-AIM+-Overlay-inspection

[R81256]
KLA Archer AIM+ Overlay inspection

Metrology
Rudolph-NSX105-Macro-Inspection

[SG40396]
Rudolph NSX105 Macro Inspection

Metrology
Hitachi-RS6000-Defect-Review-SEM

[SG68173]
Hitachi RS6000 Defect Review SEM

Metrology
KLA-EDR5210-DRSEM

[SG28910]
KLA EDR5210 DRSEM

Metrology
Carl-Zeiss-Axiotron-2-Micro-scope

[R55341]
Carl Zeiss Axiotron-2 Micro scope

Metrology
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[R24660]
KLA SFS7700 Particle Counter

Metrology
default

[B71094]Bid on Sale
KLA Ergolux 200

Metrology
default

[B71098]Bid on Sale
KLA INS2000

Metrology
AMAT-NanoSEM-3D-Scanning-Electron,-CDSEM-Measurement

[R52962]
AMAT NanoSEM 3D Scanning Electron, CDSEM Measurement

Metrology
OAI-358-Stepper-Exposure-Analyzer

[R24705]
OAI 358 Stepper Exposure Analyzer

Metrology
Nanometrics-Caliper-Elan-Overlay

[SG40314]
Nanometrics Caliper Elan Overlay

Metrology
Veeco-Dimension-X3D-AFM

[SG41750]
Veeco Dimension X3D AFM

Metrology
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Used and refurbished semiconductor equipment marketplace | SurplusGLOBAL

SurplusGLOBAL, Inc. | 56, Seochon-ro, Namsa-eup, Cheoin-gu, Yongin-si, Gyeonggi-do, 17118, Korea | Tel: +82-31-728-1400 Fax: +82-31-728-1401

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