Used and refurbished semiconductor equipment marketplace | SurplusGLOBAL Forbes Asia Best Under A Billion 2022 | Used and refurbished semiconductor equipment marketplace | SurplusGLOBAL

sitemap Sitemap

SITEMAP

Marketplace SurplusGLOBAL

Used and refurbished semiconductor equipment marketplace

Equipment List
  • facebook
  • linkedin
  • wechat
  • youtube
  • Instagram

Manufacturer

Rudolph-3Di8500-Wafer-Inspection
Rudolph-3Di8500-Wafer-Inspection
Rudolph-3Di8500-Wafer-Inspection

Download All

[In stock] Rudolph 3Di8500 Wafer Inspection

Add to Watch
List
For Sale
Contact Info
SurplusGLOBAL, USA +1-408-436-5347 Email
Product Specialist
Jackson Choi +82-31-728-1400 Email

Recommendations

Rudolph-NSX105-Macro-Inspection

[SG40396]
Rudolph NSX105 Macro Inspection

Metrology
Rudolph-Axi-S-Macro-inspection

[SG28544]
Rudolph Axi-S Macro inspection

Metrology
Hitachi-RS4000-DR-SEM

[SG32068]
Hitachi RS4000 DR SEM

Metrology
Hitachi-S-5200-FE-SEM

[SG28527]
Hitachi S-5200 FE SEM

Metrology
KLA-FX200-Thickness-measurement

[SG52657]
KLA FX200 Thickness measurement

Metrology
Novellus-C3-Speed-XT-HDP

[SG26129]
Novellus C3 Speed XT HDP

CVD
ASM-AD830+-Die-bonding

[SG81277]
ASM AD830+ Die bonding

Packaging
Advantest-M6541AD-Pick-and-Place-Memory-Handler,--30~125C---No-missing

[SG71135]
Advantest M6541AD Pick and Place Memory Handler, -30~125C / No missing

ATE
Novellus-Vector-Express-PESiN-PETEOS

[SG41745]
Novellus Vector Express PESiN/PETEOS

CVD
TEL-P-12XL

[SG71770]
TEL P-12XL

ATE
Canon-FPA-3000i4-Stepper

[SG71781]
Canon FPA-3000i4 Stepper

Stepper
KNS-ICONN

[SG66878]
KNS ICONN

Packaging
AMAT-Producer-GT-ACL

[SG47834]
AMAT Producer GT ACL

CVD
AMAT-P5000-Metal

[SG59592]
AMAT P5000 Metal

Etch
Nikon-NSR-S204B-DUV-Lithography

[R83976]
Nikon NSR-S204B DUV Lithography

Scanner
TEL-LITHIUS-i+-COT-DEV

[R78923]
TEL LITHIUS i+ COT/DEV

Track
ASM-AD830-DIE-BONDER

[SG66811]
ASM AD830 DIE BONDER

Packaging
AMAT-P5000-PECVD

[SG18125]
AMAT P5000 PECVD

CVD
AMAT-Centura-DPS2-Poly-Poly

[SG44971]
AMAT Centura DPS2 Poly Poly

Etch
Semitool-Raider-ECD310-Electroplating

[SG37946]
Semitool Raider ECD310 Electroplating

ECD

Related Items

Rudolph-Axi-S-Macro-inspection

[SG28544]
Rudolph Axi-S Macro inspection

Metrology
KLA-KLA5200XP-Overlay-measurement

[R84394]
KLA KLA5200XP Overlay measurement

Metrology
KLA-FX200-Thickness-measurement

[SG52657]
KLA FX200 Thickness measurement

Metrology
default

[R80457]
KLA INS3000

Metrology
Hitachi-S-5200-FE-SEM

[SG28527]
Hitachi S-5200 FE SEM

Metrology
default

[B71103]Bid on Sale
Rigaku SYS3630

Metrology
Nanometrics-Caliper-Mosaic-Overlay

[SG36430]
Nanometrics Caliper Mosaic Overlay

Metrology
Hitachi-RS4000-DR-SEM

[SG32068]
Hitachi RS4000 DR SEM

Metrology
Rudolph-NSX105-Macro-Inspection

[SG40396]
Rudolph NSX105 Macro Inspection

Metrology
KLA-Archer-AIM+-Overlay-inspection

[R81256]
KLA Archer AIM+ Overlay inspection

Metrology
KLA-EDR5210-DRSEM

[SG28910]
KLA EDR5210 DRSEM

Metrology
default

[R24660]
KLA SFS7700 Particle Counter

Metrology
Hitachi-S-5500-UHR-FE-SEM

[SG62830]
Hitachi S-5500 UHR FE-SEM

Metrology
default

[B71094]Bid on Sale
KLA Ergolux 200

Metrology
default

[B71098]Bid on Sale
KLA INS2000

Metrology
KLA-HRP-340-Profiler

[SG71924]
KLA HRP-340 Profiler

Metrology
OAI-358-Stepper-Exposure-Analyzer

[R24705]
OAI 358 Stepper Exposure Analyzer

Metrology
Nanometrics-Caliper-Elan-Overlay

[SG40314]
Nanometrics Caliper Elan Overlay

Metrology
Veeco-Dimension-X3D-AFM

[SG41750]
Veeco Dimension X3D AFM

Metrology
AMAT-UVision-5-Bright-Field

[R48300]
AMAT UVision 5 Bright Field

Metrology
Top

Used and refurbished semiconductor equipment marketplace | SurplusGLOBAL

SurplusGLOBAL, Inc. | 56, Seochon-ro, Namsa-eup, Cheoin-gu, Yongin-si, Gyeonggi-do, 17118, Korea | Tel: +82-31-728-1400 Fax: +82-31-728-1401

Copyright (c) SurplusGLOBAL, Inc. all rights reserved

Please select the equipment category you would like to make inquires.
Front-end
Back-end
Etc
By using this site, you agree to our updated Privacy Policy and our Cookie Policy.
I Accept

Terms & Condition

View Full Article
Agree
Close

Terms & Condition

Confirm
Close

Rudolph 3Di8500 Wafer Inspection

Download All
Close

E-mail Inquiry

  • * E-mail

  • * Name

  • * Company

  • Mobile

  • Description


Personal Information Collection and Usage Agreement

1. Purpose of collection and use of personal information - Identification and reply of e-mail inquiry
2. Collection Items: Name, Email, Contact
3. Retention and use period: 1 year
4. You have the right to deny this consent. If you disagree, you will not be able to register.

I agree to the purpose of collecting and using personal information.

Close